image001.gif (9400 bytes)Spectra DLN from Systems

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·     Scan Rates to 750 KHz

·     Fully Programmable Hardware Functions

·     ETHERNET Network Connectivity

·     Precision High Stability Transducer Energising

·     Comprehensive Strain Gauge Support

·     14 Bit Analogue to Digital Converter

·     Bandwidth Optimisation

·     Snapshot Mode for Zero Time Skew

·     Optional Anti-alias Filters

·     1µS Resolution Time Stamped Data

·     Test Definitions with Transducer

·     Calibration Tables in ACCESS

·     Internal & External Hardware Triggers

·     Slope and Threshold Level Triggers (pending implementation)

·     Fast On-line Data Display

·     Post Test Quick-look

·     Comprehensive Data Visualisation and Reports

·     Support for Spreadsheet and Engineering Analysis Software

 

Overview

 

Spectra-DLN (Dynamic Logging Node) provides cost effective high speed capture and analysis of dynamic time critical data in research, test and production applications. It is particularly suited to applications such as tests on modern materials and structures or where sudden unexpected events can occur in a test or production environment. The design concept equally allows Spectra-DLN to meet the needs of static or combination applications where data is required to be logged at different rates to ensure that only appropriate and meaningful data is available for analysis.

 

When interfaced to a PC system(s) with supporting DLN set-up and analysis software, a comprehensive and highly adaptable system provides users with the ability to readily define test requirements and store, analyse and display the resultant information using established PC Spreadsheet, Graphical and Engineering Analysis software.

 

Configurations can be organised to suit the demands and topology of the application; from a simple single Spectra-DLN and host PC arrangement, through to a large distributed multiple node arrangement with PC host and view clients.

 

The system can accommodate all common analogue transducers and digital signals at scanning speeds of up to 750,000 channels per second. An additional 'snapshot' mode of scanning allows the 'freezing' of input data to provide simultaneous, time related acquisition.

 

The system is particularly appropriate for the conditioning and measurement of strain gauges, thermocouples, prt's and many of today's modern DC energised transducers that output low or high level voltages representing engineering quantities.

 

A digital scanning module is available to provide three software programmable modes of operation. Firstly to scan single digital bits representing  external events, contact closures and logic level signals. Secondly for the measurement of pulse frequency inputs from flow meters and rotating machinery sensors and finally as a totallising counter.